Transformer testing device, and method for testing a transformer
AssigneeOmicron Electronics GmbH
InventorsDirk Flax, Markus Pütter
Life of this patent
Estimating the term…
Abstract
A transformer testing device (10) comprises outputs (31-33) for detachably connecting the transformer testing device to windings of multiple phases of a transformer (50). The transformer testing device (10) further comprises a plurality of sources (21-23), each of which is designed to generate a test signal. The transformer testing device (10) also comprises a switching matrix (40) that is connected between the plurality of sources (21-23) and the outputs (31-33).
Claims15
A transformer testing device, comprising
- outputs for releasably connecting the transformer testing device to windings of a plurality of phases of a transformer,
- a plurality of sources, wherein each source of the plurality of sources is configured in each case for generating a test signal, and
- a switching matrix connected between the plurality of sources and the outputs.
A method for testing a transformer having a plurality of phases with a transformer testing device having outputs for releasably connecting the transformer testing device to the transformer, wherein the method comprises:
- controlling a plurality of sources of the transformer testing device in each case for generating a test signal, and
- controlling a switching matrix of the transformer testing device to conductively connect at least one output of the transformer testing device selectively to one or a plurality of the sources.
Dependencies are inferred from the claim text.