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AssigneeSysmex Corporation
InventorsTakao FUJIWARA, Kazuyoshi HORII, Tatsuya KOSAKO, Tomoyuki NOSE, Sayuri TOMODA
Estimating the term…
Disclosed is a measurement apparatus including: a support mechanism configured to support a cartridge in which a chamber is formed, the chamber being configured to store a measurement sample that generates light an intensity of which varies depending on an amount of a test substance; a photodetector configured to detect the light generated from the measurement sample stored in the chamber; and a reflection member provided between the photodetector and the cartridge supported by the support mechanism, the reflection member having an inner face, the reflection member being configured to reflect, at the inner face, the light generated from the measurement sample stored in the chamber, and guide the light to the photodetector, wherein the reflection member is configured to have an area surrounded by the inner face, the area decreasing from a side where the cartridge supported by the support mechanism is provided toward a side where the photodetector is provided.
A measurement apparatus comprising:
A measurement method for measuring a test substance by using a cartridge in which a chamber is formed, the chamber being configured to store a measurement sample that generates light an intensity of which varies depending on an amount of a test substance, the method comprising:
Dependencies are inferred from the claim text.