Sample measurement system and method of retrieving tray identification information
AssigneeSysmex Corporation
InventorsHiroo TATSUTANI, Yuichiro OHMAE
Life of this patent
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AssigneeSysmex Corporation
InventorsHiroo TATSUTANI, Yuichiro OHMAE
Estimating the term…
A sample measurement system may include: a measurement unit that measures a sample in a sample container; a transport unit that transports a rack that can hold sample containers, via the measurement unit; a collection unit that is detachably provided with a tray in which racks can be set, and that collects the rack transported from the measurement unit by the transport unit and sets the rack in the tray; a storage that stores sample identification information, rack identification information, and tray identification information in association with each other; an input part; a display part; and a controller that, in a condition in which the input part receives input of the sample identification information or the rack identification information, causes the display part to display the tray identification information stored in association with the inputted sample identification information or the inputted rack identification information.
A sample measurement system comprising:
A method of retrieving tray identification information of a tray which is detachably set in a collection unit and in which a rack is set, the rack being transported to the collection unit via a measurement unit for measuring a sample stored in a sample container held in the rack, the method comprising:
Dependencies are inferred from the claim text.