Multispectral thermal imaging for detection of materials of interest
AssigneeFLIR Detection, Inc.
InventorsRobert K. Shelton, Brian D. O'Dell, Shiou-Jyh Ja
Life of this patent
Estimating the term…
Abstract
Imaging techniques are provided to determine the presence of trace chemicals corresponding to various materials of interest. In one example, a method includes receiving a test sample and capturing a plurality of infrared images of the test sample. Each infrared image corresponds to a different range of infrared radiation wavelengths. The method also includes determining a spectral profile of the test sample using the infrared images, comparing the determined spectral profile to a known spectral profile of a material of interest, and determining whether the material is present in the test sample based on the comparing. Additional methods and related devices are also provided.
Claims20
A method comprising:
- receiving a test sample;
- capturing a plurality of infrared images of the test sample, wherein each infrared image corresponds to a different range of infrared radiation wavelengths;
- determining a spectral profile of the test sample using the infrared images;
- comparing the determined spectral profile to a known spectral profile of a material of interest;
- and
- determining whether the material is present in the test sample based on the comparing.
A device comprising:
- a chamber configured to receive a test sample;
- an infrared imager configured to capture a plurality of infrared images of the test sample, wherein each infrared image corresponds to a different range of infrared radiation wavelengths;
- a plurality of filters associated with the different ranges of infrared radiation wavelengths and configured to be positioned between the test sample and the infrared imager during the capture;
- a memory comprising instructions;
- and
- a processor configured to execute the instructions to:
- determine a spectral profile of the test sample using the infrared images,
- compare the determined spectral profile to a known spectral profile of a material of interest, and
- determine whether the material is present in the test sample based on the compared spectral profiles.
Dependencies are inferred from the claim text.