Optical analyzer
AssigneeTopcon Corporation
InventorTaichi YUASA
Life of this patent
Estimating the term…
Abstract
A spectroscopic measuring device includes a halogen lamp as a light source, a lens of an irradiating system, a mirror, and a spectrometer. The lens of the irradiating optical system emits light from the halogen lamp to a measurement object. The mirror is an optical member, and the mirror is arranged coaxial with the lens and conducts detecting light between the halogen lamp and the measurement object, to the spectrometer. The spectrometer is an analyzing part and analyzes material of the measurement object on the basis of the light received via the mirror. The light from the halogen lamp to the measurement object passes through the peripheral part of the optical axis of the lens, and the light to be received by the spectrometer passes through the center part of the optical axis of the lens, at the position of the mirror.
Claims9
An optical analyzer comprising:
- a light source;
- an irradiating optical system that emits light from the light source to a measurement object;
- an optical member that shares an optical axis with the irradiating optical system and that conducts the light between the light source and the measurement object, to a light receiving part;
- and
- an analyzing part that has the light receiving part, which receives the light via the optical member, and that analyzes the material of the measurement object on the basis of the received light,
- wherein the light from the light source to the measurement object passes through a peripheral part of the optical axis, and the light to be received by the light receiving part passes through a center part of the optical axis, at the position of the optical member.
An optical analyzer comprising:
- an irradiating optical system having a light source, an elliptical mirror that concentrates light from the light source and that forms a secondary light source point, and a lens member that emits the light from the secondary light source point to a measurement object;
- an analyzing part that receives at least some of the light that has been reflected from the measurement object and that analyzes the material of the measurement object on the basis of the received light;
- and
- a reflector that is arranged so as to be coaxial with the irradiating optical system and that conducts at least some of the light that has been reflected from the measurement object, to the analyzing part,
- wherein the light to be reflected by the reflector after being reflected from the measurement object has a light flux diameter smaller than that of the light emitted from the irradiating optical system.
An optical analyzer comprising:
- an irradiating optical system having a light source, an elliptical mirror that concentrates light from the light source and that forms a secondary light source point, a lens member that shapes the light from the secondary light source point into a beam as irradiating light, and a reflector that reflects the irradiating light from the lens member to a measurement object;
- and
- an analyzing part that receives at least some of the light that has been reflected from the measurement object and that analyzes the material of the measurement object on the basis of the received light,
- wherein a center part of the reflector is made so that the light that has been reflected from the measurement object passes therethrough, and the light that has passed through the center part of the reflector after being reflected from the measurement object, is received by the analyzing part.
Dependencies are inferred from the claim text.