Three-dimensional(3d) test standard
Assignee3M Innovative Properties Company
InventorsAnthony J. Sabelli, Glenn E. Casner, Joseph C. Dingeldein, Shannon D. Scott
Life of this patent
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Abstract
Three-dimensional test objects provide for assessment of a 3D scanner over a range of scales, frequencies, and/or depths. The test objects may include a substrate having a substantially planar top surface and a plurality of surface features. In some examples, the surface features include a plurality of wedges projecting above the plane of the top surface and extending radially outward from an origin to form a three dimensional star pattern. The shape of the surface features may be periodic or non-periodic. In other examples, the depth of the surface features is decoupled from their lateral frequency.
Claims18
A test object for assessment of a three-dimensional scanner comprising:
- a substrate having a substantially planar top surface, the top surface having a substantially featureless core radius centered about an origin;
- and
- a plurality of surface features projecting above the planar top surface and extending radially outward from the featureless core radius toward a periphery of the substrate.
A test object for assessment of a three-dimensional scanner, comprising:
- a substrate having a substantially planar top surface;
- and
- a first plurality of three-dimensional surface features projecting above the planar top surface of the substrate, each of the plurality of surface features defined by a unique height measured orthogonally to the planar top surface;
- and
- a second plurality of three-dimensional surface features recessed below the planar top surface of the substrate, each of the plurality of surface features defining a recessed cavity having a unique depth measured orthogonally to the planar top surface of the substrate.
Dependencies are inferred from the claim text.