Semiconductor device and display device including the semiconductor device
AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorsJunichi KOEZUKA, Masami JINTYOU, Yukinori SHIMA
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AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorsJunichi KOEZUKA, Masami JINTYOU, Yukinori SHIMA
Estimating the term…
The reliability of a transistor including an oxide semiconductor is improved. The transistor in a semiconductor device includes a first oxide semiconductor film over a first insulating film, a gate insulating film over the first oxide semiconductor film, a second oxide semiconductor film over the gate insulating film, and a second insulating film over the first oxide semiconductor film and the second oxide semiconductor film. The first oxide semiconductor film includes a channel region overlapping with the second oxide semiconductor film, a source region and a drain region each in contact with the second insulating film. The channel region includes a first layer and a second layer in contact with a top surface of the first layer and covering a side surface of the first layer in the channel width direction. The second oxide semiconductor film has a higher carrier density than the first oxide semiconductor film.
A semiconductor device comprising a transistor,
A semiconductor device comprising a transistor,
Dependencies are inferred from the claim text.