Charged Particle Beam System and Method of Aberration Correction
AssigneeJEOL Ltd.
InventorShigeyuki Morishita
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AssigneeJEOL Ltd.
InventorShigeyuki Morishita
Estimating the term…
There is provided a charged particle beam system for reducing phase variations in a charged particle beam due to sixth order three-lobe aberration. The charged particle beam system (100) is equipped with an aberration corrector (30) for correcting aberrations in the optical system, and includes: an aberration measuring section (44) for measuring sixth order three-lobe aberration of sixth order geometric aberration, a computing section (46) for computing the magnitude of at least one of fourth order three-lobe aberration of fourth order geometric aberration and three-fold astigmatism of second order geometric aberration for reducing phase variations in the charged particle beam due to the sixth order three-lobe aberration on the basis of the measured sixth order three-lobe aberration, and a controller (48) for controlling the aberration corrector (30) to produce at least one of the fourth order three-lobe aberration and the three-fold astigmatism on the basis of the computed magnitude.
A charged particle beam system equipped with an aberration corrector for correcting aberrations in an optical system, said charged particle beam system comprising:
A method of aberration correction implemented in a charged particle beam system equipped with an aberration corrector having multiple stages of multipole elements, said method comprising the steps of:
Dependencies are inferred from the claim text.