Loading patent…
AssigneeTokyo Metropolitan Industrial Technology Research Institute
InventorsAkira MONKAWA, Shoichi NAKANISHI, Shinya ABE, Mikiya KONDO, Koh HARADA
Estimating the term…
The present invention provides a device and a method for image reconstruction at different X-ray energies that make it possible to achieve image reconstruction with higher accuracy. A device for image reconstruction at different X-ray energies includes: an X-ray source 1 that irradiates a specimen to be imaged 2 with X-rays; an energy-dispersive detector 4 that detects a characteristic X-ray emitted from the specimen to be imaged 2; a signal processing means that quantifies the peak of the characteristic X-ray detected by the detector 4; and an image reconstruction means that reconstructs an image on the basis of a signal from the signal processing means.
An X-ray three-dimensional measurement device comprising:
An X-ray three-dimensional measurement method comprising:
An X-ray three-dimensional image correction program that causes a computer to carry out an image correction step of correcting an X-ray CT image of an object to be measured which has been acquired on a three-dimensional coordinate axis such that a sinogram of the X-ray CT image converges to a sinogram of a three-dimensional shape of the object to be measured which has been actually measured on the three-dimensional coordinate axis.
Dependencies are inferred from the claim text.