Method for setting mounting position of target substrate and film forming system
AssigneeTokyo Electron Limited
InventorYasunobu SUZUKI
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AssigneeTokyo Electron Limited
InventorYasunobu SUZUKI
Estimating the term…
In a method for setting a mounting position of a target substrate, the test substrate is transferred to a second position deviated from a first position. A mask has expected arrangement position where a non-film formation region has a preset width when the target substrate is mounted at the first position and subjected to a film formation. The film is formed on the test substrate at the second position by using the mask. Width of the non-film formation region formed on the test substrate after the film formation is measured. Actual arrangement position of the mask is specified based on a direction and a distance of the deviation of the second position from the first position and the measured width of the non-film formation region. The first position is corrected such that the non-film formation region has the preset width based on the actual arrangement position of the mask.
A method for setting a mounting position of a target substrate transferred by a substrate transfer unit on a mounting table in a processing chamber of a film forming apparatus, wherein the film forming apparatus includes a ring-shaped mask which covers a surface of an edge portion of the target substrate mounted on the mounting table and subjected to film formation to form a non-film formation region at the edge portion and has an opening corresponding to a film formation region formed at an inner side of the non-film formation region, the mask having an expected arrangement position where the non-film formation region has a preset width when the target substrate is mounted at a first position on the mounting table and subjected to the film formation, the method comprising:
A film forming system comprising:
Dependencies are inferred from the claim text.