Diagnostic system for a dc-dc voltage converter

A diagnostic system for a DC-DC voltage converter, the DC-DC voltage converter having a high voltage bi-directional MOSFET switch and a low voltage bi-directional MOSFET switch, comprising:

• a first temperature sensor generating a first output voltage indicating a temperature level of the high voltage bi-directional MOSFET switch;
• a second temperature sensor generating a second output voltage indicating a temperature level of the low voltage bi-directional MOSFET switch;
• a microcontroller having an analog-to-digital converter, the analog-to-digital converter having a first bank of channels and a second bank of channels;
• the first bank of channels including a first channel, the second bank of channels including a second channel;
• the first channel being electrically coupled to the first temperature sensor for receiving the first output voltage;
• the second channel being electrically coupled to the second temperature sensor for receiving the second output voltage;
• the microcontroller being programmed to sample the first output voltage at a first sampling rate utilizing the first channel in the first bank of channels to obtain a first predetermined number of voltage samples;
• the microcontroller being further programmed to determine a first number of voltage samples in the first predetermined number of voltage samples in which the first output voltage is equal to a first non-functional voltage;
• the microcontroller being further programmed to set a first temperature diagnostic flag equal to a first fault value if the first number of voltage samples is greater than a first threshold number of voltage samples indicating that the analog-to-digital converter is malfunctioning;
• the microcontroller being further programmed to sample the second output voltage at the first sampling rate utilizing the second channel in the second bank of channels to obtain a second predetermined number of voltage samples;
• the microcontroller being further programmed to determine a second number of voltage samples in the second predetermined number of voltage samples in which the second output voltage is equal to a second non-functional voltage;
• and
• the microcontroller being further programmed to set a second temperature diagnostic flag equal to a second first fault value if the second number of voltage samples is greater than the first threshold number of voltage samples indicating the analog-to-digital converter is malfunctioning.

A diagnostic system for a DC-DC voltage converter, the DC-DC voltage converter having first and second MOSFET switches in a DC-DC converter control circuit, comprising:

• a first temperature sensor generating a first output voltage indicating a temperature level of the first MOSFET switch;
• a second temperature sensor generating a second output voltage indicating a temperature level of the second MOSFET switch;
• a microcontroller having an analog-to-digital converter, the analog-to-digital converter having a first bank of channels and a second bank of channels;
• the first bank of channels including a first channel, the second bank of channels including a second channel;
• the first channel being electrically coupled to the first temperature sensor for receiving the first output voltage;
• the second channel being electrically coupled to the second temperature sensor for receiving the second output voltage;
• the microcontroller being programmed to sample the first output voltage at a first sampling rate utilizing the first channel in the first bank of channels to obtain a first predetermined number of voltage samples;
• the microcontroller being further programmed to determine a first number of voltage samples in the first predetermined number of voltage samples in which the first output voltage is greater than a first threshold voltage;
• the microcontroller being further programmed to set a first temperature diagnostic flag equal to a first fault value if the first number of voltage samples is greater than a first threshold number of voltage samples indicating the first MOSFET switch has an over-temperature condition;
• the microcontroller being further programmed to sample the second output voltage at the first sampling rate utilizing the second channel in the second bank of channels to obtain a second predetermined number of voltage samples;
• the microcontroller being further programmed to determine a second number of voltage samples in the second predetermined number of voltage samples in which the second output voltage is greater than a second threshold voltage;
• and
• the microcontroller being further programmed to set a second temperature diagnostic flag equal to a second first fault value if the second number of voltage samples is greater than the first threshold number of voltage samples indicating the second MOSFET switch has the over-temperature condition.

A diagnostic system for a DC-DC voltage converter, the DC-DC voltage converter having first and second MOSFET switches in a DC-DC converter control circuit, comprising:

• a first temperature sensor generating a first output voltage indicating a temperature level of the first MOSFET switch;
• a second temperature sensor generating a second output voltage indicating a temperature level of the second MOSFET switch;
• a microcontroller having an analog-to-digital converter, the analog-to-digital converter having a first bank of channels and a second bank of channels;
• the first bank of channels including a first channel, the second bank of channels including a second channel;
• the first channel being electrically coupled to the first temperature sensor for receiving the first output voltage;
• the second channel being electrically coupled to the second temperature sensor for receiving the second output voltage;
• the microcontroller being programmed to sample the first output voltage at a first sampling rate utilizing the first channel in the first bank of channels to obtain a first predetermined number of voltage samples;
• the microcontroller being further programmed to determine a first number of voltage samples in the first predetermined number of voltage samples in which the first output voltage is equal to a first non-functional voltage;
• the microcontroller being further programmed to set a first temperature diagnostic flag equal to a first fault value if the first number of voltage samples is greater than a first threshold number of voltage samples indicating the analog-to-digital converter is malfunctioning;
• the microcontroller being programmed to sample the second output voltage at the first sampling rate utilizing the second channel in the second bank of channels to obtain a second predetermined number of voltage samples;
• the microcontroller being further programmed to determine a second number of voltage samples in the second predetermined number of voltage samples in which the second output voltage is greater than a second threshold voltage;
• the microcontroller being further programmed to set a second temperature diagnostic flag equal to a second first fault value if the second number of voltage samples is greater than the first threshold number of voltage samples indicating the analog-to-digital converter is malfunctioning.