Bitwise rotating scan section for microelectronic chip testing and diagnostics

A system for testing a microelectronic chip comprising:

• a processor configured to implement a scanning engine, the scanning engine configured to:
• sample a plurality of sections of the microelectronic chip, wherein each of the plurality of sections comprises at least one latch set in at least one scan chain;
• and
• determine, based on the dividing, whether each of the plurality of sections fail a data test, wherein the determining comprises:
• interleave the plurality of sections by scanning, via the processor, an alternating latch set from each scan chain in a first section, and scanning an alternating latch set from each scan chain in a second section.

A computer program product for testing a microelectronic chip, the computer program product comprising a computer readable storage medium having program instructions embodied therewith, wherein the computer readable storage medium is not a transitory signal per se, the program instructions executable by a processor running a scanning engine to cause the processor to perform a method comprising:

• dividing, via the processor, a plurality of sections of the microelectronic chip, wherein each of the plurality of sections comprises at least one latch set in at least one scan chain;
• and
• determining, via the processor, based on the dividing, whether each of the plurality of sections fail a data test, wherein the determining comprises:
• interleaving plurality of sections by scanning, via the processor, an alternating latch set from each scan chain in a first section, and scanning an alternating latch set from each scan chain in a second section.