System and methods for analyzing and estimating susceptibility of circuits to radiation-induced single-event-effects

A method comprising:

• at a semiconductor design evaluation hardware system:
• receiving first IC (integrated circuit) layout information of a placed and routed circuit design of a first semiconductor circuit from an operator device external to the semiconductor design evaluation hardware system;
• decomposing the placed and routed circuit design of the first IC layout information into a plurality of smaller circuit pieces of the circuit design, each circuit piece having placed and routed IC layout information and a gate-level net-list;
• for each circuit piece, selecting a stored set of analog circuit particle strike models based on the layout information and the gate-level net-list of the circuit piece and radiation environment information received for the first IC layout information, wherein each particle strike model has charge voltage circuit components with radiation susceptibility charge voltage values corresponding to a respective particle strike of a radiation environment identified by the received radiation environment information, and wherein each particle strike model corresponds to a different particle strike of the radiation environment;
• for each selected particle strike model of a circuit piece:
• determining a radiation susceptibility metric by comparing functional results generated by functional simulation of the of the particle strike model with functional results generated by functional simulation of the circuit piece;
• and
• for each circuit piece, determining a radiation susceptibility metric for the circuit piece based on the radiation susceptibility metrics generated for each selected particle strike model of the circuit piece.