Noise spectrum analysis for electronic device

A method for analyzing noise spectrum of an electronic device, the method comprising:

• storing, in a memory device, a waveform data including a plurality of data points, wherein the waveform data is obtained by measuring a target signal from the electronic device;
• removing data points, from the plurality of data points in the waveform data, corresponding to a background noise fluctuation based on a smooth curve of the waveform data, such that the data points are extracted from the waveform data, wherein the extracted data points comprise candidates for peaks in the waveform data;
• classifying the extracted data points based on a distance between adjacent data points in order to discriminate a cluster of distant data points from data points closely positioned to one or more dominant peaks, each distant data point in the cluster of distant data points defining a region in the waveform data associated to a characteristic of the electronic device;
• determining the one or more dominant peaks based on the cluster of distant data points such that the data points closely positioned to the determined one or more dominant peaks are ignored, wherein each dominant peak corresponds to the characteristic of the electronic device;
• and
• outputting the one or more dominant peaks as an analysis result for the electronic device.