X-ray diffractometer
AssigneeRigaku Corporation
InventorsShintaro KOBAYASHI, Katsuhiko INABA
Life of this patent
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Abstract
An X-ray diffractometer for obtaining X-ray diffraction angles of diffracted X-rays by detecting with an X-ray detector diffracted X-rays diffracted at a sample when X-rays are emitted at the sample at each angle of the angles about a center point of goniometer circles, the X-ray diffractometer having a pinhole member provided with a pinhole, the pinhole allowing X-rays diffracted from the sample to pass so that the diffracted X-rays pass through the center point of the goniometer circle, and other diffracted X-rays are shielded by the pinhole member.
Claims8
An X-ray diffractometer for obtaining X-ray diffraction angles of diffracted X-rays by detecting with an X-ray detector diffracted X-rays diffracted at a sample when X-rays are emitted at the sample at each angle of angles about a center point of goniometer circles,
- comprising an X-ray shield member provided with an X-ray passage port,
- wherein:
- the X-rays diffracted at the sample so as to pass through the center point of the goniometer circles pass through the X-ray passage port;
- and
- the X-rays diffracted at the sample so as to pass through areas other than the center point of the goniometer circles are shielded by the X-ray shield member.
Dependencies are inferred from the claim text.