System for analysing a transparent sample with control of position, and associated method

Abstract

A system for analyzing a transparent particle including: an analysis pathway, including a first light source emitting an analysis light beam, and a first optical system focusing the analysis light beam in a focusing plane; and a position control pathway including a second light source, an image sensor, and a second optical system at least partially merged with the first optical system. The image sensor is offset relative to the image of the focusing plane by the second optical system. The system makes it possible to control correct positioning of the particle, even though it is transparent, and without disturbing the analysis pathway.

Dependencies are inferred from the claim text.