Nano material testing apparatus and method for testing material using the same
AssigneeUnist (Ulsan National Institute of Science and Technology)
InventorsJu Young KIM, Young Cheon KIM, Si Hoon KIM
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AssigneeUnist (Ulsan National Institute of Science and Technology)
InventorsJu Young KIM, Young Cheon KIM, Si Hoon KIM
Estimating the term…
A nano material testing apparatus includes a main frame; a testing unit including an actuator and a load cell connected to the actuator; a jig unit configured to be connected to the testing unit and including an upper jig that clamps one side of an upper portion of the nano material specimen and a lower jig that is located below the upper jig and clamps one side of a lower portion of the nano material specimen; a stage unit configured to be connected to the lower jig; a first alignment unit configured to be located to be spaced apart from a front surface of the nano material specimen; a second alignment unit configured to be located to be spaced apart from side surfaces of the nano material specimen; and a controller.
A nano material testing apparatus comprising:
A method for testing a material using a nano material testing apparatus including a testing unit including an actuator coupled to an upper portion of a main frame and generating displacement of a nano material specimen and a load cell connected to the actuator, a jig unit configured to be connected to the testing unit and comprising an upper jig that clamps one side of an upper portion of the nano material specimen and a lower jig that is located below the upper jig and clamps one side of a lower portion of the nano material specimen, a stage unit configured to make the lower jig to be moved in a multi-axis direction, a first alignment unit configured to provide an image of a front surface of the nano material specimen and to allow alignment in a direction of the front surface of the nano material specimen to be checked, a second alignment unit configured to provide an image of side surfaces of the nano material specimen and to allow alignment in a direction of the side surfaces of the nano material specimen to be checked, a specimen auxiliary fixing device configured to selectively clamp the other side of the nano material specimen, and a load cell protection device that is selectively connected to the upper jig by moving forward/backward, the method comprising:
Dependencies are inferred from the claim text.