US 2017/0363392 A1Published application

Apparatus and methods for parallel testing of devices

AssigneeThe United States of America as represented by the Secretary of the Navy

InventorMark Halter

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Abstract

Apparatus and methods for reducing device testing times, such as missile testing times, are disclosed. The apparatus and methods may execute tests or portions of tests in a parallel manner. The apparatus and methods ensure that tests or portions of tests executing in parallel do not interfere with one another. The apparatus and methods may assess the current state of the test environment to confirm whether it is acceptable to advance one or more tests. If the testing environment is not acceptable for a test to continue executing, the apparatus and methods do not allow the test to advance. The testing environment may be monitored by measuring one or more vital signs, where the vital signs may indicate whether it is safe for a particular test to advance. As such, the apparatus and methods provide an efficient way to test devices such as missiles.

Claims30

Dependent claims

A test system comprising:

a test missile;
an electronic device operably coupled to the test missile and comprising:
first stage concurrent determination test logic configured to:
determine that a plurality of first stage tests to be executed on the test missile do not require a missile target or high pressure gas for testing of the test missile;
concurrently execute the plurality of first stage tests on the test missile by determining when data will be made available for each of the plurality of first stage tests and executing a portion of the plurality of first stage tests that may be completed before the data is made available for each of the plurality of first stage tests;
and
provide an indication of whether the plurality of first stage tests completed successfully;
second stage concurrent determination test logic configured to:
determine that a plurality of second stage tests to be executed on the test missile require a first type missile target and high pressure gas for testing of the test missile;
concurrently execute the plurality of second stage tests on the test missile by determining when data will be made available for each of the plurality of second stage tests and executing a portion of the plurality of second stage tests that may be completed before the data is made available for each of the plurality of second stage tests;
and
provide an indication of whether the plurality of second stage tests completed successfully;
and
third stage concurrent determination test logic configured to:
determine that a plurality of third stage tests to be executed on the test missile require a second type missile target for testing of the test missile;
concurrently execute the plurality of third stage tests on the test missile by determining when data will be made available for each of the plurality of third stage tests and executing a portion of the plurality of third stage tests that may be completed before the data is made available for each of the plurality of third stage tests;
and
provide an indication of whether the plurality of third stage tests completed successfully.

15 more elements

A method in an electronic device comprising:

determining that a plurality of first stage tests to be executed on a test missile do not require a missile target or high pressure gas for testing of the test missile;
concurrently executing the plurality of first stage tests on the test missile by determining when data will be made available for each of the plurality of first stage tests and executing a portion of the plurality of first stage tests that may be completed before the data is made available for each of the plurality of first stage tests;
determining that a plurality of second stage tests to be executed on the test missile require a first type missile target and high pressure gas for testing of the test missile;
concurrently executing the plurality of second stage tests on the test missile by determining when data will be made available for each of the plurality of second stage tests and executing a portion of the plurality of second stage tests that may be completed before the data is made available for each of the plurality of second stage tests;
determining that a plurality of third stage tests to be executed on the test missile require a second type missile target for testing of the test missile;
and
concurrently executing the plurality of third stage tests on the test missile by determining when data will be made available for each of the plurality of third stage tests and executing a portion of the plurality of third stage tests that may be completed before the data is made available for each of the plurality of third stage tests;
and
providing an indication of whether the plurality of first stage tests, plurality of second stage tests, and plurality of third stage tests completed successfully.

6 more elements

A test system comprising:

a device under test;
an electronic device operably coupled to the device under test and comprising:
first stage concurrent determination test logic configured to:
determine that a plurality of first stage tests to be executed on the device under test require a first test environment;
concurrently execute the plurality of first stage tests on the device under test by determining when data will be made available for each of the plurality of first stage tests and executing a portion of the plurality of first stage tests that may be completed before the data is made available for each of the plurality of first stage tests;
and
provide an indication of whether the plurality of first stage tests completed successfully;
second stage concurrent determination test logic configured to:
determine that a plurality of second stage tests to be executed on the device under test require a second test environment;
concurrently execute the plurality of second stage tests on the device under test by determining when data will be made available for each of the plurality of second stage tests and executing a portion of the plurality of second stage tests that may be completed before the data is made available for each of the plurality of second stage tests;
and
provide an indication of whether the plurality of second stage tests completed successfully;
and
third stage concurrent determination test logic configured to:
determine that a plurality of third stage tests to be executed on the device under test require a third test environment;
concurrently execute the plurality of third stage tests on the device under test by determining when data will be made available for each of the plurality of third stage tests and executing a portion of the plurality of third stage tests that may be completed before the data is made available for each of the plurality of third stage tests;
and
provide an indication of whether the plurality of third stage tests completed successfully.

15 more elements

Dependencies are inferred from the claim text.