Novel spectral ct systems and methods
AssigneeRensselaer Polytechnic Institute
InventorsGe Wang, Yan Xi, Wenxiang Cong, Zaifeng Shi
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Abstract
Novel and advantageous methods and systems for performing spectral computed tomography are provided. An edge-on detector, such as a silicon strip detector, can be used to receive X-rays after passing through a sample to be imaged. An energy resolving process can be performed on the collected X-ray radiation. The CT scanner can have third-generation or fourth-generation geometry.
Claims33
A method of imaging, comprising:
- providing X-ray radiation to a sample to be imaged;
- collecting the X-ray radiation with a detector;
- and
- performing an energy resolving process on collected charges of the collected X-ray radiation.
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An imaging system, comprising:
- a computed tomography scanner including an X-ray source;
- a detector for receiving X-ray radiation from the X-ray source after it passes through a sample to be imaged;
- a processor;
- and
- a non-transitory machine-readable medium in operable communication with the processor and having machine-executable instructions stored thereon that, when executed by the processor, perform the following energy resolving process;
- determining a generated charge density within the detector using Formula 1:
- m1E1N1ak1+m2E2N2ak2+ . . . +mnEnNnakn=gk(x) Formula 1
- where Ei is photon energy, Ni is photon density with energy Ei, aki is the attenuation coefficient of photon with energy Ei for the given material thickness, mi is an empirical coefficient that represents the number of generated charges by photons with energy Ei per energy unit, and gk(x) is the generated charge density within the material of the detector of a specific thickness;
- and
- repeating the determination of the generated charge density at a different thickness within the material of the detector.
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Dependencies are inferred from the claim text.