Ion beam device
AssigneeHitachi High-Technologies Corporation
InventorsHiroyuki MUTO, Yoshimi KAWANAMI
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AssigneeHitachi High-Technologies Corporation
InventorsHiroyuki MUTO, Yoshimi KAWANAMI
Estimating the term…
In this invention, vibrations generated by a freezer from a cooling mechanism for cooling an ion source emitter tip are prevented from being transmitted to the emitter tip as much as possible, while the cooling capability of the cooling mechanism is improved widely. The ion beam device (10) is equipped with: an ion source housing (22) provided with an emitter tip (45) and defining an ion source chamber (27) supplied with an ionization gas or gas molecules; a gas pot (51) provided in the ion source chamber (27) so as to be thermally connected to the emitter tip (45) and accommodated so as to have no direct physical contact with a cooling stage (57) of a freezer (52); and a spacer (59) provided on the peripheral surface of the cooling stage (57) housed by the gas pot (51) and maintaining a given interval or greater between the peripheral surface of the cooling stage (57) and the internal peripheral surface of the gas pot (52).
An ion beam device comprising:
A freezer that is used in an ion beam device, which includes an emitter tip to generate an ion in an ion source chamber defined by an ion source housing and supplied with an ionization gas or gas molecules, to cool the emitter tip, the freezer comprising:
A mounting method of a cooling mechanism that is used in an ion beam device, which includes an emitter tip to generate an ion in an ion source chamber defined by an ion source housing and supplied with an ionization gas or gas molecules, to cool the emitter tip, the method comprising:
Dependencies are inferred from the claim text.