Dual loop susceptor temperature control system
AssigneeApplied Materials, Inc.
InventorJohn M. WHITE
Life of this patent
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AssigneeApplied Materials, Inc.
InventorJohn M. WHITE
Estimating the term…
Embodiments described herein generally relate to a temperature control system for a substrate support assembly disposed in a substrate processing system. In one embodiment, a temperature control system is disclosed herein. The temperature control system includes a remote fluid source and a main frame system. The remote fluid source includes a first reservoir and a second reservoir. The main frame system includes a first fluid loop and a second fluid loop. The first fluid loop is coupled to, and configured to receive a first fluid from, the first reservoir. The second fluid loop is coupled to and configured to receive a second fluid from the second reservoir. The first proportioning valve has a first inlet in communication with the first fluid loop and a second inlet in communication with the second fluid loop. The first proportioning valve has an outlet configured to flow a third fluid.
A temperature control system, comprising:
A system for processing a substrate, comprising:
A method of controlling a temperature of a substrate support assembly, comprising:
Dependencies are inferred from the claim text.