Dual-Guard Imager Probe
AssigneeSchlumberger Technology Corporation
InventorsHenri BUDAN, Alexandre ABELLAN, Sofiane ELLOUZ, Emmanuel LEGENDRE
Life of this patent
Estimating the term…
Loading patent…
AssigneeSchlumberger Technology Corporation
InventorsHenri BUDAN, Alexandre ABELLAN, Sofiane ELLOUZ, Emmanuel LEGENDRE
Estimating the term…
The present disclosure introduces an apparatus for downhole measurement of a formation resistivity. The apparatus includes a probe having a button electrode, a first guard electrode insulated from the button electrode, a second guard electrode insulated from the first guard electrode, and a return electrode positioned external to the second guard electrode. The apparatus also includes an electrical source for setting a voltage drop between the second guard electrode and the return electrode, a first impedance (RBOG) electrically coupled between the button electrode and the second guard electrode, and a second impedance (RIGOG) electrically coupled between the first guard electrode and the second guard electrode.
An apparatus operable for downhole measurement of a formation resistivity, comprising:
A method, comprising:
Dependencies are inferred from the claim text.