Baseline shift determination for a photon detector
AssigneeKoninklijke Philips N.V.
InventorEwald ROESSL
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Abstract
The present invention relates to determining baseline shift of an electrical signal generated by a photon detector (102) of an X-ray examination device (101). For this purpose, the photon detector comprises a processing unit (103) that is configured to determine a first crossing frequency of a first pulse height threshold by the electrical signal generated by the photon detector. The first pulse height threshold is located at a first edge of a noise peak in the pulse height spectrum of the electrical signal.
Claims15
Processing unit for processing an electrical signal generated by a photon detector of an x-ray examination device;
- wherein the processing unit is configured to determine a baseline shift of the electrical signal by determining a change of a first rate of exceeding a first pulse height threshold by the electrical signal;
- and
- wherein the first pulse height threshold is a pulse height at a first edge of a noise peak in a pulse height spectrum of the electrical signal.
The x-ray examination device according to claim 11, further comprising:
- an x-ray source;
- a control unit for turning off the x-ray source when the processing unit determines the baseline shift.
A method for determining a baseline shift in an electrical signal of a photon detector of an x-ray examination device, the method comprising the steps:
- determining a change of a first rate of exceeding a first pulse height threshold by the electrical signal, wherein the first pulse height threshold is a pulse height at a first edge of a noise peak in a pulse height spectrum of the electrical signal;
- and
- determining the baseline shift of the electrical signal on the basis of the determined change of the first rate.
Dependencies are inferred from the claim text.