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US 2017/0322254 A1Published application
Self testing fault circuit apparatus and method
AssigneeLeviton Manufacturing Co., Inc.
InventorsMichael OSTROVSKY, Adam KEVELOS
Life of this patent
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Abstract
A process for self testing a fault circuit includes disabling an actuator, performing a self test by creating a simulated fault signal across at least a portion of a half cycle of a first polarity and across at least a portion of a half cycle of a second polarity, and determining whether the self test was successful.
Claims28
1-34. (canceled)
A process for self testing a fault circuit comprising:
- a) disabling an actuator;
- b) performing a self test by creating a simulated fault signal across at least a portion of a half cycle of a first polarity and across at least a portion of a half cycle of a second polarity;
- and
- c) determining whether the self test was successful.
1 more element
(canceled)
-58. (canceled)
64-77. (canceled)
Dependencies are inferred from the claim text.