System for analysis of a microwave frequency signal by imaging

A system for analyzing a microwave-frequency signal by imaging, comprising:

• a solid material at least one optical property of which is modifiable in at least one zone (Zo) of said material, when said zone is simultaneously in the presence of an optical excitation or electrical excitation and a microwave-frequency signal having at least one frequency coinciding with a resonant frequency of the material,
• said material furthermore being such that a value of said resonant frequency varies as a function of the amplitude of a magnetic field,
• a magnetic field generator configured to generate a magnetic field having, in the interior of a portion of said zone, a spatial amplitude variation in a direction X, said material then having a resonant frequency that is dependent on a position (x) in said direction X, and
• a detector configured to receive an image of said zone (Zo) in said direction X,
• said image containing at least one intensity variation resulting from the modification of the optical property, a position of which in the spectral image depends on a corresponding frequency value of said microwave frequency signal to be analyzed illuminating said zone of the material, when said zone is simultaneously in the presence of an optical excitation (Eo) or electrical excitation and said magnetic field.