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US 2017/0322235 A1Published application
Electrical probe
AssigneeChroma Ate Inc.
InventorsMao-Sheng LIU, Hsiu-Wei KUO
Life of this patent
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Abstract
An electrical probe includes a main body, a probe head and a plurality of pins. The probe head is disposed on the main body, and the probe head has a surface and a plurality of openings on the surface. Each pin includes a contacting portion and an inserting portion connected to each other. Each pin has an obtuse angle between the contacting portion and the inserting portion, and the inserting portions of the pins respectively inserted into the openings.
Claims15
An electrical probe, comprising:
- a main body;
- a probe head disposed on the main body, the probe head having a surface and a plurality of openings on the surface;
- and
- a plurality of pins each comprising a contacting portion and an inserting portion connected to each other, each of the pins having an obtuse angle between the contacting portion and the inserting portion, and the inserting portions of the plurality of pins respectively inserted into the plurality of openings.
1 more element
An electrical probe, comprising:
- a main body comprising an assembling member and a conductive member disposed through the assembling member;
- a probe head disposed on the main body, the probe head having a surface, a through hole and a plurality of openings, the plurality of openings and the through hole being on the surface, and the conductive member disposed through the through hole;
- and
- a plurality of pins each comprising a contacting portion and an inserting portion connected to each other, the inserting portions of the plurality of pins respectively inserted into the plurality of openings, the contacting portion extending from the surface along a direction away from the probe head, and an extension axis of the contacting portion and a central axis of the through hole having an acute angle therebetween.
1 more element
Dependencies are inferred from the claim text.