Chemical element analysis device and method for contaminants in liquid
AssigneeGwangju Institute of Science and Technology
InventorsKi Hong PARK, Gi Baek KIM, Kyoung Woong KIM
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Abstract
The present invention relates to a chemical element analysis device and method for contaminants in a liquid. The chemical element analysis device for contaminants in a liquid according to the present invention comprises: a sample storage unit 10 for storing a sampled liquid sample 1; a laser unit 20 for emitting a laser beam 21: 21a, 21b, and 21c and irradiating the laser beam 21 to the sample 1: 1a, 1b, and 1c sprayed from the sample storage unit 10; and a spectrometer 30 for collecting plasma light 31: 31a, 31b, and 31c generated by irradiating the laser beam 21 to the sample 1, and measuring a spectrum of the plasma light 31.
Claims27
An apparatus for performing elemental analysis of contaminants in a liquid, the apparatus comprising:
- a sample storage unit for storing a sampled liquid sample;
- a laser unit for generating and irradiating a laser beam to the sample sprayed from the sample storage unit;
- and
- a spectrometer for collecting plasma light generated by the irradiation of the laser beam onto the sample and measuring a spectrum of the plasma light.
A method for performing elemental analysis of contaminants in a liquid, the method comprising the steps of:
- (a) storing a sampled liquid sample;
- (b) spraying the stored sample and irradiating a laser beam onto the sample sprayed;
- and
- (c) collecting plasma light generated by the irradiation of the laser beam onto the sample and measuring a spectrum of the plasma light.
Dependencies are inferred from the claim text.