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US 2017/0322147 A1Published application
Atomic absorption photometer and atomic absorption measurement method
AssigneeShimadzu Corporation
InventorKazuo SUGIHARA
Life of this patent
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Abstract
There are provided an atomic absorption photometer and an atomic absorption measurement method which can easily perform background correction in a short time period by using a plurality of types of methods while suppressing the amount of samples consumed. Background correction is performing by using each of the D2 lamp method, the Zeeman method, and a self-reversal method, according to measurement data in each of measurement periods T41 to T46 obtained in one data acquisition cycle. Background correction is performed on the common measurement data (atomic absorption data) obtained in the atomic absorption measurement period T41, by using the measurement data (background data) obtained in each of the first to third background measurement periods T44, T46, and T42.
Claims8
An atomic absorption photometer comprising:
- an atomization unit configured to generate atomic vapor by atomizing a sample;
- a first light source configured to irradiate the atomic vapor generated at the atomization unit with a measuring beam for atomic absorption measurement;
- a second light source configured to irradiate the atomic vapor generated at the atomization unit with a measuring beam for background measurement;
- a magnetic field generation unit configured to generate a magnetic field at the atomization unit;
- a detector configured to acquire measurement data by detecting light having passed through the atomization unit;
- a measurement data acquisition processing unit configured to acquire measurement data in each of an atomic absorption measurement period in which a measuring beam is emitted from the first light source in a state where no magnetic field is generated by the magnetic field generation unit, a first background measurement period in which a measuring beam is emitted from the second light source in a state where no magnetic field is generated by the magnetic field generation unit, a second background measurement period in which a measuring beam is emitted from the first light source in a state where a magnetic field is generated by the magnetic field generation unit, and a third background measurement period in which a measuring beam is emitted from the first light source with an overcurrent in a state where no magnetic field is generated by the magnetic field generation unit, in a data acquisition cycle including the atomic absorption measurement period, the first background measurement period, the second background measurement period, and the third background measurement period;
- a first background correction processing unit configured to correct the measurement data obtained in the atomic absorption measurement period by using a D2 lamp method, according to the measurement data obtained in the first background measurement period;
- a second background correction processing unit configured to correct the measurement data obtained in the atomic absorption measurement period by using a Zeeman method, according to the measurement data obtained in the second background measurement period;
- and
- a third background correction processing unit configured to correct the measurement data obtained in the atomic absorption measurement period by using a self-reversal method, according to the measurement data obtained in the third background measurement period.
7 more elements
An atomic absorption photometer comprising:
- an atomization unit configured to generate atomic vapor by atomizing a sample;
- a first light source configured to irradiate the atomic vapor generated at the atomization unit with a measuring beam for atomic absorption measurement;
- a second light source configured to irradiate the atomic vapor generated at the atomization unit with a measuring beam for background measurement;
- a magnetic field generation unit configured to generate a magnetic field at the atomization unit;
- a detector configured to acquire measurement data by detecting light having passed through the atomization unit;
- a measurement data acquisition processing unit configured to acquire measurement data in each of an atomic absorption measurement period in which a measuring beam is emitted from the first light source in a state where no magnetic field is generated by the magnetic field generation unit, a first background measurement period in which a measuring beam is emitted from the second light source in a state where no magnetic field is generated by the magnetic field generation unit, and a second background measurement period in which a measuring beam is emitted from the first light source in a state where a magnetic field is generated by the magnetic field generation unit, in a data acquisition cycle including the atomic absorption measurement period, the first background measurement period, and the second background measurement period;
- a first background correction processing unit configured to correct the measurement data obtained in the atomic absorption measurement period by using a D2 lamp method, according to the measurement data obtained in the first background measurement period;
- and
- a second background correction processing unit configured to correct the measurement data obtained in the atomic absorption measurement period by using a Zeeman method, according to the measurement data obtained in the second background measurement period.
6 more elements
An atomic absorption photometer comprising:
- an atomization unit configured to generate atomic vapor by atomizing a sample;
- a first light source configured to irradiate the atomic vapor generated at the atomization unit with a measuring beam for atomic absorption measurement;
- a magnetic field generation unit configured to generate a magnetic field at the atomization unit;
- a detector configured to acquire measurement data by detecting light having passed through the atomization unit;
- a measurement data acquisition processing unit configured to acquire measurement data in each of an atomic absorption measurement period in which a measuring beam is emitted from the first light source in a state where no magnetic field is generated by the magnetic field generation unit, a second background measurement period in which a measuring beam is emitted from the first light source in a state where a magnetic field is generated by the magnetic field generation unit, and a third background measurement period in which a measuring beam is emitted from the first light source with an overcurrent in a state where no magnetic field is generated by the magnetic field generation unit, in a data acquisition cycle including the atomic absorption measurement period, the second background measurement period, and the third background measurement period;
- a second background correction processing unit configured to correct the measurement data obtained in the atomic absorption measurement period by using a Zeeman method, according to the measurement data obtained in the second background measurement period;
- and
- a third background correction processing unit configured to correct the measurement data obtained in the atomic absorption measurement period by using a self-reversal method, according to the measurement data obtained in the third background measurement period.
5 more elements
An atomic absorption photometer comprising:
- an atomization unit configured to generate atomic vapor by atomizing a sample;
- a first light source configured to irradiate the atomic vapor generated at the atomization unit with a measuring beam for atomic absorption measurement;
- a second light source configured to irradiate the atomic vapor generated at the atomization unit with a measuring beam for background measurement;
- a detector configured to acquire measurement data by detecting light having passed through the atomization unit;
- a measurement data acquisition processing unit configured to acquire measurement data in each of an atomic absorption measurement period in which a measuring beam is emitted from the first light source, a first background measurement period in which a measuring beam is emitted from the second light source, and a third background measurement period in which a measuring beam is emitted from the first light source with an overcurrent, in a data acquisition cycle including the atomic absorption measurement period, the first background measurement period, and the third background measurement period;
- a first background correction processing unit configured to correct the measurement data obtained in the atomic absorption measurement period by using a D2 lamp method, according to the measurement data obtained in the first background measurement period;
- and
- a third background correction processing unit configured to correct the measurement data obtained in the atomic absorption measurement period by using a self-reversal method, according to the measurement data obtained in the third background measurement period.
5 more elements
An atomic absorption measurement method for measuring atomic absorption by using an atomic absorption photometer including:
- an atomization unit configured to generate atomic vapor by atomizing a sample;
- a first light source configured to irradiate the atomic vapor generated at the atomization unit with a measuring beam for atomic absorption measurement;
- a second light source configured to irradiate the atomic vapor generated at the atomization unit with a measuring beam for background measurement;
- a magnetic field generation unit configured to generate a magnetic field at the atomization unit;
- and a detector configured to acquire measurement data by detecting light having passed through the atomization unit, the method comprising:
- a measurement data acquisition step of acquiring measurement data in each of an atomic absorption measurement period in which a measuring beam is emitted from the first light source in a state where no magnetic field is generated by the magnetic field generation unit, a first background measurement period in which a measuring beam is emitted from the second light source in a state where no magnetic field is generated by the magnetic field generation unit, a second background measurement period in which a measuring beam is emitted from the first light source in a state where a magnetic field is generated by the magnetic field generation unit, and a third background measurement period in which a measuring beam is emitted from the first light source with an overcurrent in a state where no magnetic field is generated by the magnetic field generation unit, in a data acquisition cycle including the atomic absorption measurement period, the first background measurement period, the second background measurement period, and the third background measurement period;
- a first background correction step of correcting the measurement data obtained in the atomic absorption measurement period by using a D2 lamp method, according to the measurement data obtained in the first background measurement period;
- a second background correction step of correcting the measurement data obtained in the atomic absorption measurement period by using a Zeeman method, according to the measurement data obtained in the second background measurement period;
- and
- a third background correction step of correcting the measurement data obtained in the atomic absorption measurement period by using a self-reversal method, according to the measurement data obtained in the third background measurement period.
7 more elements
An atomic absorption measurement method for measuring atomic absorption by using an atomic absorption photometer including:
- an atomization unit configured to generate atomic vapor by atomizing a sample;
- a first light source configured to irradiate the atomic vapor generated at the atomization unit with a measuring beam for atomic absorption measurement;
- a second light source configured to irradiate the atomic vapor generated at the atomization unit with a measuring beam for background measurement;
- a magnetic field generation unit configured to generate a magnetic field at the atomization unit;
- and a detector configured to acquire measurement data by detecting light having passed through the atomization unit, the method comprising:
- a measurement data acquisition step of acquiring measurement data in each of an atomic absorption measurement period in which a measuring beam is emitted from the first light source in a state where no magnetic field is generated by the magnetic field generation unit, a first background measurement period in which a measuring beam is emitted from the second light source in a state where no magnetic field is generated by the magnetic field generation unit, and a second background measurement period in which a measuring beam is emitted from the first light source in a state where a magnetic field is generated by the magnetic field generation unit, in a data acquisition cycle including the atomic absorption measurement period, the first background measurement period, and the second background measurement period,
- a first background correction step of correcting the measurement data obtained in the atomic absorption measurement period by using a D2 lamp method, according to the measurement data obtained in the first background measurement period;
- and
- a second background correction step of correcting the measurement data obtained in the atomic absorption measurement period by using a Zeeman method, according to the measurement data obtained in the second background measurement period.
6 more elements
An atomic absorption measurement method for measuring atomic absorption by using an atomic absorption photometer including:
- an atomization unit configured to generate atomic vapor by atomizing a sample;
- a first light source configured to irradiate the atomic vapor generated at the atomization unit with a measuring beam for atomic absorption measurement;
- a magnetic field generation unit configured to generate a magnetic field at the atomization unit, and a detector configured to acquire measurement data by detecting light having passed through the atomization unit, the method comprising:
- a measurement data acquisition step of acquiring measurement data in each of an atomic absorption measurement period in which a measuring beam is emitted from the first light source in a state where no magnetic field is generated by the magnetic field generation unit, a second background measurement period in which a measuring beam is emitted from the first light source in a state where a magnetic field is generated by the magnetic field generation unit, and a third background measurement period in which a measuring beam is emitted from the first light source with an overcurrent in a state where no magnetic field is generated by the magnetic field generation unit, in a data acquisition cycle including the atomic absorption measurement period, the second background measurement period, and the third background measurement period;
- a second background correction step of correcting the measurement data obtained in the atomic absorption measurement period by using a Zeeman method, according to the measurement data obtained in the second background measurement period;
- and
- a third background correction step of correcting the measurement data obtained in the atomic absorption measurement period by using a self-reversal method, according to the measurement data obtained in the third background measurement period.
4 more elements
An atomic absorption measurement method for measuring atomic absorption by using an atomic absorption photometer including:
- an atomization unit configured to generate atomic vapor by atomizing a sample;
- a first light source configured to irradiate the atomic vapor generated at the atomization unit with a measuring beam for atomic absorption measurement;
- a second light source configured to irradiate the atomic vapor generated at the atomization unit with a measuring beam for background measurement, and a detector configured to acquire measurement data by detecting light having passed through the atomization unit, the method comprising:
- a measurement data acquisition step of acquiring measurement data in each of an atomic absorption measurement period in which a measuring beam is emitted from the first light source, a first background measurement period in which a measuring beam is emitted from the second light source, and a third background measurement period in which a measuring beam is emitted from the first light source with an overcurrent, in a data acquisition cycle including the atomic absorption measurement period, the first background measurement period, and the third background measurement period;
- a first background correction step of correcting the measurement data obtained in the atomic absorption measurement period by using a D2 lamp method, according to the measurement data obtained in the first background measurement period;
- and
- a third background correction step of correcting the measurement data obtained in the atomic absorption measurement period by using a self-reversal method, according to the measurement data obtained in the third background measurement period.
4 more elements
Dependencies are inferred from the claim text.