Back to results
US 2017/0322133 A1Published application
Methods and apparatus for determining particle characteristics by utilizing force on particles
OwnerMichael Trainerinventor
Life of this patent
Estimating the term…
Abstract
An instrument for measuring characteristics of particles. A particle sample is introduced into a sample cell. The sample particles are subjected to gravitational or centrifugal forces wherein particle motion is dependent upon particle characteristics. The particles are illuminated by an illumination device to produce light scattered by the particles. The light is detected by at least one detector. Characteristics of the particles are determined from the detector signals.
Claims31
An apparatus for determining characteristics of particles as determined from measurements of scattered light from particles, comprising:
- a) illumination means which illuminates particles wherein said illumination means comprises a light source,
- b) a sample cell which contains a particle dispersion and which provides optical access for said illumination means to illuminate at least one particle in said sample cell, wherein a portion of light from said illumination means is scattered by particles,
- c) at least one detection means which measures at least one parameter derived from light scattered from at least one particle in said sample cell, wherein said detection means comprises at least one light detector,
- d) force means which produces forces on said particles to cause particle motion, wherein at least one particle related characteristic of said particle dispersion is generally the same throughout said particle dispersion in said sample cell before application of said forces, wherein said measuring by said detection means is performed during at least one time period, wherein a start of said time period occurs during or after application of said forces, and
- e) calculation means which determines at least one characteristic of said particles by utilizing said measurements of said detection means, wherein said measurements are affected by at least one motion characteristic of said particle motion.
2 more elements
A method for determining characteristics of particles as determined from measurements of scattered light from particles, comprising:
- a) providing a sample cell which contains a particle dispersion and which provides optical access for a illumination means to illuminate at least one particle in said sample cell, wherein a portion of light from said illumination means is scattered by particles and wherein said illumination means comprises a light source,
- b) producing forces on said particles by utilizing a force means to cause particle motion, wherein at least one particle related characteristic of said particle dispersion is generally the same throughout said particle dispersion in said sample cell before application of said forces,
- c) illuminating particles with a illumination means,
- d) measuring at least one parameter derived from light scattered from particles, utilizing at least one detection means, wherein said detection means comprises at least one light detector, wherein said measuring by said detection means is performed during at least one time period, wherein a start of said time period occurs during or after application of said forces, and
- e) determining at least one characteristic of said particles by utilizing said measurements of said detection means, wherein said measurements are affected by at least one motion characteristic of said particle motion.
2 more elements
A method for determining characteristics of particles as determined from measurements of scattered light from particles, comprising:
- a) containing a particle dispersion in a sample cell which provides optical access for a illumination means to illuminate at least one particle in said sample cell, wherein a portion of light from said illumination means is scattered by particles and wherein said illumination means comprises a light source,
- b) attaching said sample cell to a rotating portion of a centrifuge,
- c) producing forces on said particles to cause particle motion, wherein said force comprises centrifugal force produced by said centrifuge, wherein said sample cell is attached to said rotating portion of said centrifuge during application of said centrifugal force on said particles,
- d) detaching said sample cell from said centrifuge after said application of centrifugal force on said particles in said sample cell,
- e) attaching said sample cell to a cell holder which is not an integral part of said centrifuge,
- f) illuminating particles with said illumination means,
- g) detecting scattered light utilizing said detection means which measures at least one parameter derived from light scattered from particles, wherein said detection means comprises at least one light detector,
- h) performing translational motion between said sample cell and an optical system, wherein a preferred direction of said translational motion is generally along a direction of said particle motion, wherein said optical system comprises said detection means and said illumination means and wherein said optical system is not an integral part of said centrifuge,
- i) measuring scattered light characteristics from particles in each of a set of regions wherein a center of each region is located at a different position in said sample cell, wherein said translational motion of step (h) provides motion between regions, said measuring comprising performing step (f) and step (g), and
- j) calculating at least one characteristic of said particles by utilizing said measurements of said detection means, wherein said measurements are affected by at least one motion characteristic of said particle motion.
7 more elements
Dependencies are inferred from the claim text.