US 2017/0322110 A1 · Systems and Methods for Determining the Quality of a Reproduced (Manufactured) Optic Device

Abstract

A method for assessing the similarity between a power profile of a manufactured optic device and a nominal power profile upon which the power profile of the manufactured optic device is based. The method comprises measuring the power profile of manufactured optic device, identifying a region of interest from the measured power profile of manufactured optic device, and applying an offset to the measured power profile to substantially minimize a statistical quantifier for quantifying the similarity between the nominal power profile and the offset measured power profile. The method further comprises comparing the offset and the statistical quantifier to predefined quality control metrics, determining whether the measured power profile meets the predefined quality control metrics based, at least in part on the comparison. In exemplary embodiments, the method may further comprise determining whether to associate the manufactured optic device with another nominal power profile, if the measured power profile does not meet the predefined quality control metrics.

Claims34

Dependent claims

A method for assessing the similarity between a power profile and/or a surface profile of a manufactured optic device, mold, and/or cavity and a corresponding nominal power profile and/or a nominal surface profile upon which the power profile and/or the surface profile of the manufactured optic device, mold, and/or cavity is based, the method comprising:

measuring the power profile and/or the surface profile of manufactured optic device, mold, and/or cavity;
identifying one or more regions of interest from the measured power profile and/or measured surface profile of manufactured optic device, mold, and/or cavity;
determining at least one offset (X and/or Y) to the measured power profile and/or measured surface profile to substantially minimize a statistical quantifier for quantifying the similarity between the corresponding nominal power profile and/or surface profile and the offset measured power profile;
comparing the offset and the statistical quantifier to predefined quality control metrics;
and
determining whether the measured power profile meets the predefined quality control metrics based, at least in part on the comparison.

3 more elements

A system for assessing the similarity between a power profile and/or surface profile of a manufactured optic device, mold, and/or cavity and a corresponding nominal power profile and/or surface profile upon which the power profile and/or surface profile of the manufactured optic device, mold, and/or cavity is based, the system comprising:

an input for receiving the power profile and/or surface profile of the manufactured optic device, mold, and/or cavity;
and
a processor configured to:
identify at least one region of interest from the measured power profile and/or measured surface profile of manufactured optic device, mold, and/or cavity;
determine at least one offset (X and/or Y) to the measured power profile and/or measured surface profile to substantially minimize a statistical quantifier for quantifying the similarity between the nominal power profile and/or nominal surface profile and the offset measured power profile and/or offset measured surface profile;
compare the offset and the statistical quantifier to predefined quality control metrics;
and
determine whether the measured power profile meets the predefined quality control metrics based, at least in part on the comparison.

5 more elements

Dependencies are inferred from the claim text.

Systems and Methods for Determining the Quality of a Reproduced (Manufactured) Optic Device

Life of this patent

Systems and Methods for Determining the Quality of a Reproduced (Manufactured) Optic Device

Life of this patent

Abstract

Claims34