Measuring amplitude and phase response of measurement instrument with binary phase shift keying test signal
AssigneeKeysight Technologies, Inc.
InventorEdward M. Barich
Life of this patent
Estimating the term…
Loading patent…
AssigneeKeysight Technologies, Inc.
InventorEdward M. Barich
Estimating the term…
A system and method employ an exclusive-OR gate having a first input configured to receive an RF carrier signal having an RF carrier, and a second input configured to receive a square wave signal having a square wave frequency, to output to a signal processing channel under test a binary phase shift keying (BPSK) signal comprising the RF carrier signal modulated by the square wave signal. A digital signal processor is configured to receive from the signal processing channel in-phase (I) and quadrature-phase (Q) data produced by the signal processing channel in response to the BPSK signal, and to process the I and Q data to determine an amplitude response and phase response of the signal processing channel as a function of frequency.
A method, comprising:
A system, comprising:
A system, comprising:
Dependencies are inferred from the claim text.