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US 2017/0307495 A1Published application
Particle characterization
AssigneeMalvern Instruments Limited
InventorsJason Cecil William CORBETT, David BRYCE
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Abstract
A particle characterization apparatus comprising: a light source for illuminating a sample with a light beam; a detector arranged to detect scattered light from the interaction of the light beam with the sample; and a focus tuneable lens arranged to collect the scattered light for the detector from a scattering volume and/or to direct the light beam into the sample.
Claims22
A particle characterisation apparatus comprising:
- a light source for illuminating a sample with a light beam;
- a detector arranged to detect scattered light from the interaction of the light beam with the sample;
- and a focus tuneable lens arranged to collect the scattered light for the detector from a scattering volume and/or to direct the light beam into the sample.
A method of performing a dynamic or static light scattering measurement, comprising:
- illuminating the sample with a light beam, thereby producing scattered light by the interaction of the light beam with the sample;
- detecting scattered light along a detection optical path that intersects the light beam within the sample at a detection region, thereby obtaining data;
- adjusting at least one of a location of the detection region, a volume of the detection region, or an angle between the illumination and detection optical path at the detection region, by changing the focal length of a focus tuneable lens in at least one of the illumination and detection optical path;
- repeating, at least once, the step of detecting scattered light after performing at least one corresponding step of adjustment by changing the focal length of the focus tuneable lens;
- performing a static or dynamic light scattering measurement using the data obtained from at least one focal length of the focus tuneable lens.
2 more elements
Dependencies are inferred from the claim text.