Stochastic Jitter Measuring Device and Method
AssigneeRohde & Schwarz GmbH & Co. KG
InventorThomas Schweiger
Life of this patent
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Abstract
A jitter measuring setup (10) comprises a signal generator (14), a sample-and-hold circuit (15), and the inventive all stochastic jitter measuring device (1) comprising signal acquisition means (2) and calculation means (3). The input signal of the sample-and-hold circuit (15) is generated by the signal generator (14). Furthermore, the output signal of the sample-and-hold circuit (15), respectively the input signal of the measuring device (1), is comprised of a superposition of the sampled input signal of the sample-and-hold circuit (15) and a cyclostationary random process.
Claims19
A measuring device for measuring jitter of an input signal consisting of sampling values, wherein the measuring device comprises:
- signal acquisition means, and
- calculation means,
- wherein the signal acquisition means are configured to gain a set of samples of a cyclostationary random process K(Φ), to which the jitter of the input signal is mapped, by obtaining a first number of samples N for a second number of unique phases Nph, and sorting the first number of samples N by phase up front, and
- wherein the calculation means are configured to calculate the cyclostationary variance σK2(Φ) of the input signal.
A measuring method for measuring jitter of an input signal consisting of sampling values, wherein the measuring method comprises the steps of:
- gaining a set of samples of a cyclostationary random process K(Φ), to which the jitter of the input signal is mapped, by obtaining a first number of samples N for a second number of unique phases Nph,
- sorting the first number of samples N by phase up front, and
- calculating the cyclostationary variance σK2(Φ) of the input signal.
A computer program with program code means for performing the following steps on a computer device or a digital signal processor:
- gaining a set of samples of a cyclostationary random process K(Φ), to which the jitter of the input signal is mapped, by obtaining a first number of samples N for a second number of unique phases Nph,
- sorting the first number of samples N by phase up front, and
- calculating the cyclostationary variance σK2(Φ) of the input signal.
Dependencies are inferred from the claim text.