Linear noise reduction for a test and measurement system
AssigneeTektronix, Inc.
InventorsJohn J. Pickerd, Kan Tan
Life of this patent
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AssigneeTektronix, Inc.
InventorsJohn J. Pickerd, Kan Tan
Estimating the term…
Disclosed is a mechanism for reducing noise caused by an analog to digital conversion in a test and measurement system. An adaptive linear filter is generated based on a converted digital signal and measured signal noise. The adaptive linear filter includes a randomness suppression factor for alleviating statistical errors caused by a comparison of a signal circularity coefficient and a noise circularity coefficient in the adaptive linear filter. The adaptive linear filter is applied to the digital signal along with a stomp filter and a suppression clamp filter. The digital signal may be displayed in a complex frequency domain along with depictions of the adaptive linear filter frequency response and corresponding circularity coefficients. The display may be animated to allow a user to view the signal and/or filters in the frequency domain at different times.
A test and measurement system comprising:
A computer readable storage medium having instructions stored thereon that, when executed by a processor of a test and measurement system, cause the test and measurement system to:
A method comprising:
Dependencies are inferred from the claim text.