# US 2017/0288669 A1 · Calibration circuit and calibration apparatus including the same > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 2017/0288669 A1 - Document ID: US20170288669A1 - Status: Published application - Kind: A1 - Application number: 15/626,648 - Filed: 2017-06-19 - Published: 2017-10-05 - Earliest claimed: 2014-10-28 - Assignees: SK hynix Inc. - Applicants: SK hynix Inc. - Inventors: Oung Sic CHO; Jong Hoon OH - Web page: https://patentgrep.com/patent/US20170288669A1 ## CPC - H03K 19/0005: {Modifications of input or output impedance} - H03K: PULSE TECHNIQUE (measuring pulse characteristics G01R; modulating sinusoidal oscillations with pulses H03C; transmission of digital information H04L; discriminator circuits detecting phase difference between two signals by counting or integrating cycles of oscillation H03D3/04; automatic control, starting, synchronisation or stabilisation of generators of electronic oscillations or pulses where the type of generator is irrelevant or unspecified H03L; coding, decoding or code conversion, in general H03M) ## Abstract A calibration circuit sharing a resistor for impedance matching includes a command decoder configured to receive a command signal and decode the command signal into a calibration enable signal; a selector configured to select one of the calibration enable signal and a start signal according to a select signal, and provide a driving signal; and a calibration driver configured to perform an impedance matching operation in response to the driving signal, and generate a completion signal when performance is completed, wherein the start signal corresponds to a completion signal provided from another calibration circuit which shares the resistor for the impedance matching. ## Claims ### Claim 1 A calibration circuit sharing a resistor for impedance matching, comprising: a command decoder configured to receive a command signal and decode the command signal into a calibration enable signal; a selector configured to select one of the calibration enable signal and a start signal according to a select signal, and provide a driving signal; and a calibration driver configured to perform an impedance matching operation in response to the driving signal, and generate a completion signal when performance is completed, wherein the start signal corresponds to a completion signal provided from another calibration circuit which shares the resistor for the impedance matching. ### Claim 2 (depends on 1) The calibration circuit according to claim 1, wherein the command decoder selectively provides the calibration enable signal to the selector according to a chip select signal. ### Claim 3 (depends on 1) The calibration circuit according to claim 1, further comprising: a register configured to receive a mode signal indicating an order of a corresponding calibration circuit among calibration circuits which share the resistor for the impedance matching, and provide the select signal. ### Claim 4 (depends on 1) The calibration circuit according to claim 1, wherein the calibration driver comprises a completion signal generation unit configured to generate the completion signal when a preset time has passed after the impedance matching operation is started in response to the driving signal. ### Claim 5 (depends on 1) The calibration circuit according to claim 1, wherein the calibration driver comprises a completion signal generation unit configured to generate the completion signal when a matching code generated according to the impedance matching operation is not changed for a predetermined time. ### Claim 6 A calibration apparatus comprising: a first calibration circuit configured to perform an impedance matching operation according to a resistor for impedance matching in response to a first calibration enable signal generated by decoding a command signal, and generate a completion signal when performance is completed; and a second calibration circuit configured to share the resistor for the impedance matching with the first calibration circuit, and perform an impedance matching operation according to the completion signal. ### Claim 7 (depends on 6) The calibration apparatus according to claim 6, wherein the first calibration circuit is formed on a first die, the second calibration circuit is formed on a second die, and the calibration apparatus is formed on one substrate. ### Claim 8 (depends on 7) The calibration apparatus according to claim 7, wherein the second calibration circuit comprises: a command decoder configured to receive the command signal and generate a second calibration enable signal; a selector configured to select the completion signal between the completion signal and the second calibration enable signal according to a select signal, and provide a driving signal; and a calibration driver configured to perform the impedance matching operation according to the driving signal. ### Claim 9 (depends on 8) The calibration apparatus according to claim 8, wherein the command decoder selectively generates the second calibration enable signal by receiving a chip select signal. ### Claim 10 (depends on 8) The calibration apparatus according to claim 8, further comprising: a register configured to receive a mode signal indicating an order of the second calibration circuit among a plurality of calibration circuits which share the resistor for the impedance matching and provide the select signal. ### Claim 11 (depends on 8) The calibration apparatus according to claim 8, wherein a voltage corresponding to a select signal for indicating an order of the second calibration circuit among a plurality of calibration circuits which share the resistor for the impedance matching is received through a pad. ### Claim 12 (depends on 6) The calibration apparatus according to claim 6, wherein the first calibration circuit comprises a completion signal generation unit configured to generate the completion signal when a preset time has passed after the impedance matching operation is started. ### Claim 13 (depends on 6) The calibration apparatus according to claim 6, wherein the first calibration circuit comprises a completion signal generation unit configured to generate the completion signal when a matching code generated according to the impedance matching operation is not changed for a predetermined time. ### Claim 14 A calibration circuit, comprising: a selector configured to select a calibration enable signal or a start signal in response to a select signal to provide a driving signal; a calibration driver configured to perform an impedance matching operation according to the driving signal and generate a completion signal, wherein the calibration driver performs the impedance matching operation by comparing a value received from a resistor for impedance matching to a reference value for generating a matching code. ### Claim 15 (depends on 14) The calibration circuit according to claim 14, wherein the calibration driver comprises: an impedance comparison unit configured to receive the value of the resistor for the impedance matching and compare the value with the reference value for the generating of the matching code. ### Claim 16 (depends on 15) The calibration circuit according to claim 15, wherein the calibration driver comprises: a matching code generation unit configured to generate a matching code according to a comparison signal. ### Claim 17 (depends on 16) The calibration circuit according to claim 16, wherein the calibration driver comprises: a completion signal generation unit configured to generate a completion signal when the impedance matching is completed. ### Claim 18 (depends on 17) The calibration circuit according to claim 17, wherein the completion signal is generated when the matching code is not changed for a predetermined time. ### Claim 19 (depends on 14) The calibration circuit according to claim 14, wherein the impedance matching is performed repeatedly with a constant cycle after being initiated in response to the driving signal. ### Claim 20 (depends on 16) The calibration circuit according to claim 16, wherein the impedance comparison unit provides the comparison signal to the matching code generation unit.