Techniques for determining emitted radiation intensity
AssigneeFLIR Systems, Inc.
InventorSteffen De Muynck
Life of this patent
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Abstract
Systems and methods according to one or more embodiments are provided for determining an emitted radiation intensity of an object in a thermal image. In one example, a system includes a memory component configured to store a plurality of captured thermal images of a scene and a processor. The processor is configured to select a pixel on a thermal image corresponding to a measured radiation intensity associated with an object in the scene. Real world coordinates of the object are determined. An emitted radiation intensity of the object is calculated using the determined real world coordinates and the measured radiation intensity. Additional systems and methods are also provided.
Claims20
A method comprising:
- capturing a thermal image of a scene by an image capture component;
- selecting a pixel of the thermal image, wherein the pixel has a value corresponding to a measured radiation intensity associated with an object in the scene;
- determining real world coordinates of the object;
- and
- calculating an emitted radiation intensity of the object using the determined real world coordinates and the measured radiation intensity.
A system comprising:
- a memory component configured to store a plurality of captured thermal images of a scene by an image capture component;
- a processor configured to:
- select a pixel of the thermal image, wherein the pixel has a value corresponding to a measured radiation intensity associated with an object in the scene;
- determine real world coordinates of the object;
- and
- calculate an emitted radiation intensity of the object using the determined real world coordinates and the measured radiation intensity.
Dependencies are inferred from the claim text.