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US 2017/0263277 A1Published application
Recording medium, method of manufacturing fullerene thin film, recording reproducing apparatus, information recording method, and information reading method
AssigneeShowa Denko K.K.
InventorsSho TONEGAWA, Masatoshi ICHIKAWA, Kenzo HANAWA
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Abstract
According to the present invention, there is provided a recording medium comprising a substrate, a platinum layer formed on the substrate and having a (111) plane preferentially oriented, and a fullerene single crystal thin film formed on the platinum layer, and configured to be a recording layer, wherein an average value of average surface roughness Ra's with respect to four or more visual fields measured by using an atomic force microscope in a surface of the fullerene thin film is 0.5 nm or less.
Claims18
A recording medium comprising:
- a substrate;
- a platinum layer formed on the substrate and having a (111) plane preferentially oriented;
- and
- a fullerene thin film formed on the platinum layer and configured to be a recording layer,
- wherein an average value of average surface roughness Ra's with respect to four or more visual fields measured by using an atomic force microscope in a surface of the fullerene thin film is 0.5 nm or less.
2 more elements
A method of manufacturing a fullerene thin film, comprising:
- a step of forming a platinum layer by sputtering on a substrate;
- and
- a step of forming a fullerene layer by vacuum evaporation on the platinum layer.
Dependencies are inferred from the claim text.