# US 2017/0254642 A1 · Dynamic Digital Fringe Projection Techniques For Measuring Warpage > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 2017/0254642 A1 - Document ID: US20170254642A1 - Status: Published application - Kind: A1 - Application number: 15/517,934 - Filed: 2014-10-10 - Published: 2017-09-07 - Earliest claimed: 2014-10-10 - Assignees: Georgia Tech Research Corporation - Applicants: Georgia Tech Research Corporation - Inventors: Ifeanyi Charles Ume; Sungbum Kang - Web page: https://patentgrep.com/patent/US20170254642A1 ## CPC - G01B 11/2527: {with phase change by in-plane movement of the patern} - G01B 11/25: by projecting a pattern, e.g. {one or more lines,} moiré fringes on the object (G01B11/255 takes precedence {; image analysis for depth or shape recovery G06T7/50}) - G01B 11/2513: {with several lines being projected in more than one direction, e.g. grids, patterns} - G01B 11/2518: {Projection by scanning of the object} - G01B 11/2536: {using several gratings with variable grating pitch, projected on the object with the same angle of incidence} - G01B 11/2545: {with one projection direction and several detection directions, e.g. stereo} - G01B 11/306: {for measuring evenness} - G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ## Abstract Dynamic digital fringe projection (DDFP) techniques for measuring warpage. The DDFP technique generates a dynamic fringe pattern, in which a proper fringe intensity distribution is dynamically determined based on the surface reflectance of an unpainted sample in order to obtain better fringe image contrasts. The DDFP technique includes the automatic segmentation method to segment the chip package and PWB regions in an unpainted PWB assembly PWBA image. It also includes calibration methods to compensate the mismatches in coordinates and intensities between the projected and captured images. ## Claims ### Claim 1 A method of measuring warpage of a sample having a first region of a first surface reflectance and a second region of a second surface reflectance comprising: projecting a dynamic fringe pattern onto the first and second regions, wherein the dynamic fringe pattern comprises an intensity distribution based upon the first surface reflectance and the second surface reflectance; capturing phase-shifted fringe images of the dynamic fringe pattern reflected from the first and second regions of the sample; generating a wrapped-phase image from the phase-shifted fringe images; unwrapping the wrapped-phase image to obtain an unwrapped-phase image; and converting the unwrapped-phase image into a displacement image indicative of warpage of the first region and the second region of the sample. ### Claim 2 (depends on 1) The method of claim 1, wherein: the sample comprises a printed wiring board assembly (PWBA); the first region of the PWBA comprises one or more chip packages; and the second region of the PWBA comprises a printed wiring board. ### Claim 3 (depends on 15) The method of claim 15 further comprising: segmenting the sample into the first region and the second region prior to projecting the dynamic fringe pattern. ### Claim 4 (depends on 3) The method of claim 3, wherein segmenting the sample comprises: capturing a capture image of the sample; smoothening the capture image using a Gaussian filter to generate at least two smoothened features; generating edges around the smoothened features using a Canny algorithm to generate an edged image having at least two edged regions; segmenting the edged regions in the edged image with labels using a region-growing algorithm to generate a label image having the first and second regions; and detecting the first and second regions in the label image using geometric analysis. ### Claim 5 A method of measuring warpage of at least a portion of a PWBA having a first region of a first surface reflectance and a second region of a second surface reflectance comprising: projecting a dynamic fringe pattern onto the first and second regions, wherein the dynamic fringe pattern comprises an intensity distribution based upon the first surface reflectance and the second surface reflectance, the dynamic fringe pattern containing sinusoidal fringes with different intensity distributions for each of the regions; capturing phase-shifted fringe images of at least a portion of the dynamic fringe pattern reflected from the first and second regions of at least a portion of the PWBA; generating a wrapped-phase image from the phase-shifted fringe images; unwrapping the wrapped-phase image to obtain an unwrapped-phase image; and converting the unwrapped-phase image into a displacement image indicative of warpage of the first region and the second region of at least a portion of the PWBA. ### Claim 6 (depends on 5) The method of claim 5, wherein: the first region of the PWBA comprises one or more chip packages; and the second region of the PWBA comprises a printed wiring board. ### Claim 7 (depends on 5) The method of claim 5 further comprising segmenting the PWBA into the first region and the second region prior to projecting the dynamic fringe image. ### Claim 8 (depends on 7) The method of claim 7, wherein segmenting the PWBA comprises: capturing a capture image of the PWBA; smoothening the capture image using a Gaussian filter to generate at least two smoothened features; generating edges around the smoothened features using a Canny algorithm to generate an edged image having at least two edged regions; segmenting the edged regions in the edged image with labels using a region-growing algorithm to generate a label image having the first and second regions; and detecting the first and second regions in the label image using geometric analysis. ### Claim 9 (depends on 5) The method of claim 5 further comprising performing coordinate calibration between the projected dynamic fringe image and the captured phase-shifted fringe images. ### Claim 10 (depends on 5) The method of claim 5 further comprising performing intensity calibration between the projected dynamic fringe image and the captured phase-shifted fringe images. ### Claim 11 A method of measuring warpage of a sample having a first region of a first surface reflectance and a second region of a second surface reflectance comprising: segmenting the sample into the first region and the second region; generating a dynamic projected image from a dynamic fringe pattern, the dynamic fringe pattern comprising sinusoidal fringes with different intensity distributions for each of the regions; projecting the dynamic projected image onto the first and second regions, wherein the dynamic projected image comprises an intensity distribution based upon the first surface reflectance and the second surface reflectance; capturing phase-shifted images of the dynamic projected image reflected from the first and second regions of the sample; generating a wrapped-phase image from the phase-shifted images; unwrapping the wrapped-phase image to obtain an unwrapped-phase image; and converting the unwrapped-phase image into a displacement image evidencing warpage of the first region and the second region of the sample. ### Claim 12 (depends on 11) The method of claim 11, wherein segmenting the sample comprises: capturing a capture image of the sample; smoothening the capture image using a Gaussian filter to generate at least two smoothened features; generating edges around the smoothened features using a Canny algorithm to generate an edged image having at least two edged regions; segmenting the edged regions in the edged image with labels using a region-growing algorithm to generate a label image having the first and second regions; and detecting the first and second regions in the label image using geometric analysis. ### Claim 13 (depends on 11) The method of claim 11 further comprising performing coordinate calibration between the projected dynamic image and the captured phase-shifted images. ### Claim 14 (depends on 11) The method of claim 11 further comprising performing intensity calibration between the projected dynamic image and the captured phase-shifted images. ### Claim 15 (depends on 1) The method of claim 1 further comprising generating the dynamic fringe pattern by: projecting a uniform image onto the sample; capturing a reflected surface image of the sample; converting coordinates of the regions in the captured image to coordinates in the projected image after calibrating coordinate mismatches between captured and projected images; and calibrating intensity mismatches between captured and projected images for each of the regions; wherein the dynamic fringe pattern contains sinusoidal fringes with different intensity distributions for each of the regions. ### Claim 16 (depends on 15) The method of claim 15, wherein calibrating coordinate mismatches between captured and projected images comprise obtaining coordinate transfer functions (CTFs) between the projected and captured images. ### Claim 17 (depends on 15) The method of claim 15, wherein calibrating coordinate mismatches between captured and projected images comprise: capturing a checker pattern image of the sample, which checker pattern divides a captured image and a projected image into a plurality of divisions; obtaining similar coordinates of at least a portion of the divisions in the captured image; obtaining a coordinate transfer function (CTF) that transfers coordinates from the captured image to the projected image; and calculating specific coordinates in the projected image from those in the captured image using the CTF. ### Claim 18 (depends on 15) The method of claim 15, wherein the divisions are square division; and wherein obtaining similar coordinates of at least a portion of the divisions in the captured image comprises obtaining the coordinates two or more corners of at least a portion of the square divisions in the captured image. ### Claim 19 (depends on 15) The method of claim 15, wherein calibrating coordinate mismatches between captured and projected images comprises: generating a checker pattern; projecting the checker pattern onto the sample; capturing a checker pattern image of the sample, which checker pattern divides a captured image and a projected image into a plurality of divisions; obtaining similar coordinates of at least a portion of the divisions in the captured image; obtaining a coordinate transfer function (CTF) that transfers coordinates from the captured image to the projected image; and calculating specific coordinates in the projected image from those in the captured image using the CTF. ### Claim 20 (depends on 15) The method of claim 15, wherein calibrating intensity mismatches between captured and projected images for each of the regions comprises: projecting uniform images with different intensities onto the sample and capturing those images; obtaining a third-order polynomial regression equation between projected and captured intensities using the projected and captured images; using the regression equation as the intensity transfer function (ITF) for the sample; and calculating specific intensities in the projected image from those in the captured image using the ITF.