Method of Forming Ultra-Thin Nanowires
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsMartin Christopher Holland, Blandine Duriez
Life of this patent
Estimating the term…
Loading patent…
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsMartin Christopher Holland, Blandine Duriez
Estimating the term…
Provided is a method of forming a nanowire-based device. The method includes forming a first mask layer over a substrate; forming a first opening in the first mask layer; growing a first nanowire that protrudes through the first opening in the first mask layer, wherein the first nanowire has a first diameter; removing the first mask layer; oxidizing a sidewall of the first nanowire; etching the oxidized sidewall of the first nanowire; forming a second mask layer overlaying the substrate; removing the first nanowire thereby forming a second opening in the second mask layer; and growing a second nanowire that protrudes through the second opening in the second mask layer, wherein the second nanowire has a second diameter and the second diameter is different than the first diameter.
A method comprising:
A method comprising:
A method comprising:
Dependencies are inferred from the claim text.