Low stress vias
AssigneeTessera, Inc.
InventorsIlyas Mohammed, Belgacem Haba, Cyprian Emeka Uzoh
Life of this patent
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AssigneeTessera, Inc.
InventorsIlyas Mohammed, Belgacem Haba, Cyprian Emeka Uzoh
Estimating the term…
A component can include a substrate having a front surface and a rear surface remote therefrom, an opening extending from the rear surface towards the front surface, and a conductive via extending within the opening. The substrate can have a CTE less than 10 ppm/° C. The opening can define an inner surface between the front and rear surfaces. The conductive via can include a first metal layer overlying the inner surface and a second metal region overlying the first metal layer and electrically coupled to the first metal layer. The second metal region can have a CTE greater than a CTE of the first metal layer. The conductive via can have an effective CTE across a diameter of the conductive via that is less than 80% of the CTE of the second metal region.
A method of fabricating a component, comprising:
A method of fabricating a component, comprising:
Dependencies are inferred from the claim text.