Substrate processing method and recording medium
AssigneeTokyo Electron Limited
InventorsTomonari URANO, Kyohei NOGUCHI, Osamu YOKOYAMA, Takashi KOBAYASHI, Satoshi WAKABAYASHI, Takashi SAKUMA
Life of this patent
Estimating the term…
Loading patent…
AssigneeTokyo Electron Limited
InventorsTomonari URANO, Kyohei NOGUCHI, Osamu YOKOYAMA, Takashi KOBAYASHI, Satoshi WAKABAYASHI, Takashi SAKUMA
Estimating the term…
A substrate processing method is for forming a metal film on a target substrate by using a plasma. The method includes loading a target substrate having a silicon-containing layer on a surface thereof into a processing chamber which is pre-coated by a film containing a metal, introducing hydrogen gas and a gaseous compound of the metal and halogen into the processing chamber, generating a plasma, and forming a metal film on the target substrate. The method further includes performing a first reduction process of forming an atmosphere of a plasma obtained by activating hydrogen gas in the processing chamber, unloading the target substrate from the processing chamber, performing a second reduction process of forming an atmosphere of a plasma obtained by activating hydrogen gas in the processing chamber, and loading a next target substrate into the processing chamber.
A substrate processing method for forming a metal film on a target substrate by using a plasma, comprising:
Dependencies are inferred from the claim text.