Semiconductor manufacturing method and semiconductor device
AssigneeKabushiki Kaisha Toshiba
InventorYumi TANAKA
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AssigneeKabushiki Kaisha Toshiba
InventorYumi TANAKA
Estimating the term…
A semiconductor manufacturing method includes forming a first film on an upper surface of a substrate. The semiconductor manufacturing method includes forming concave portions extending from an upper surface of the first film to below the upper surface of the substrate. The method includes forming a second film from bottom surfaces of the concave portions to a first position in the concave portions between the upper surface of the first film and the upper surface of the substrate. The method includes forming a third film in the concave portions to cover side walls of the concave portions and an upper surface of the second film. The method includes grinding the third film to expose the second film. The method includes removing the second film. The method includes forming a fourth film from the bottom surfaces of the concave portions to at least a lower surface of the third film.
A semiconductor manufacturing method comprising:
The method of claim 4, wherein
A semiconductor device comprising:
Dependencies are inferred from the claim text.