Automated optical metrology computer aided inspection station and method of operation
AssigneeLevel 3 Inspection, LLC
InventorsWilliam J. Greene, Scott T. McAfee
Life of this patent
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AssigneeLevel 3 Inspection, LLC
InventorsWilliam J. Greene, Scott T. McAfee
Estimating the term…
An automated 3D Optical Metrology Scanning and Computer Aided Inspection System for dimensional inspection of precision manufactured parts. The system example and implemented configuration is based within a relocatable cabinet providing ambient light and optional temperature control. The cabinet further includes a part placement area having an optical metrology scanner positioned over a multi-axis robotic arm positioned in the part placement area. The robotic arm is constructed and arranged to grip and manipulate parts within a field of view of the optical metrology scanner. The robotic arm provides adequate multi-axis control to rotate and tilt and translate tp manipulate the part to allow substantially every surface of the part to be scanned. Dimensional comparison and analysis software application provide geometric conformance/deviation plus extraction of the dimensions indicated in the part computer aided design (CAD) model.
An Inspection System comprising:
A method for full and complete dimensional inspection of precision manufactured parts comprising the steps of:
Dependencies are inferred from the claim text.