Memory diagnosis system
AssigneeSamsung Electronics Co., Ltd.
InventorsKYUNG-RYUN KIM, Ki-Tae Park
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Abstract
A memory diagnosis system includes a memory device and a server. The memory device includes a memory module configured to adjust operational parameters in response to a parameter control signal, a memory controller configured to generate the parameter control signal in response to a feedback signal, and a memory state monitor configured to monitor the memory module to generate an information signal that includes information on a state of the memory module. The server is configured to generate the feedback signal in response to the information signal.
Claims20
A memory diagnosis system comprising:
- a memory device comprising:
- a memory module configured to adjust operational parameters in response to a parameter control signal;
- a memory controller configured to generate the parameter control signal in response to a feedback signal;
- and
- a memory state monitor configured to monitor the memory module to generate an information signal that includes information on a state of the memory module;
- and
- a server configured to generate the feedback signal in response to the information signal.
A memory diagnosis system comprising:
- a memory device comprising:
- a memory module;
- and
- a memory state monitor configured to monitor the memory module to generate an information signal that includes information on a state of the memory module and configured to generate a malfunction alert of the memory module in response to a feedback signal;
- and
- a server configured to receive the information signal and configured to generate the feedback signal, which indicates a malfunction of the memory module, by using the information on the state of the memory module.
A method of diagnosing a memory module included in a memory device, the method comprising:
- determining a bit error rate from an information signal transmitted from the memory device;
- determining whether the bit error rate is higher than a first reference value;
- activating a feedback signal to warn of a danger of malfunction of the memory module when the bit error rate is higher than the first reference value;
- and
- transmitting the feedback signal to the memory device.
Dependencies are inferred from the claim text.