Microcontroller and method for testing a microcontroller
AssigneeInfineon Technologies AG
InventorsJayakrishna Guddeti, Deepa Chandran, Shivaprasad Sadashivaiah
Life of this patent
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Abstract
A microcontroller includes a data memory configured to store test signal data. The microcontroller further includes a signal generator configured to process the test signal data in order to provide at least one test signal. The microcontroller also includes a circuit under test configured to process the test signal. The test signal data includes at least one pattern snippet and an associated pattern descriptor. The pattern snippet includes data concerning a content of a part of the test signal. The associated pattern descriptor includes data concerning a pattern formed by the pattern snippet within the test signal.
Claims18
A microcontroller, comprising:
- a data memory configured to store test signal data,
- a signal generator configured to process the test signal data in order to provide at least one test signal, and
- at least one circuit under test configured to process the test signal,
- wherein the test signal data comprises at least one pattern snippet and at least one pattern descriptor associated with the pattern snippet,
- wherein the pattern snippet comprises data concerning a content of a part of the test signal, and
- wherein the associated pattern descriptor comprises data concerning a pattern formed by the pattern snippet within the test signal.
A method for testing a microcontroller, comprising:
- generating at least one test signal by a signal generator comprised by the microcontroller using test signal data,
- submitting the test signal to a circuit under test comprised by the microcontroller, and
- evaluating a response of the circuit under test to the test signal, wherein the test signal data comprises at least one pattern snippet and at least one pattern descriptor associated with the pattern snippet,
- wherein the pattern snippet comprises data concerning a content of a part of the test signal, and
- wherein the associated pattern descriptor comprises data concerning a pattern formed by the pattern snippet within the test signal.
Dependencies are inferred from the claim text.