Testing system, device of a data collecting chip and control method thereof

A testing system of a data collecting chip, comprising:

• a testing device of the data collecting chip, the testing device comprises:
• a data collecting module being connected to the data collecting chip, and configured to receive multi-frame sampling data collected by the data collecting chip;
• a storing module being configured to store the multiple frames of sampling data;
• a processing module being configured to calculate noise of the plurality of data sampling points according to the multiple frames of sampling data to obtain a noise test result;
• a data transceiving module being configured to upload the noise test result to an upper computer;
• and
• a control module being configured to control the data collecting module, the storing module, the processing module and the data transceiving module;
• an automatic test equipment (ATE) being connected to the testing device of the data collecting chip;
• and
• a personal computer (PC) being connected to the ATE, the PC obtaining a noise test result uploaded by the testing device of the data collecting chip via the ATE, and then performing corresponding operations on the data collecting chip according to the noise test result.

A control method for a testing device of a data collecting chip, wherein the data collecting chip comprises a plurality of data sampling points, the control method comprises:

• receiving multiple frames of sampling data collected by the data collecting chip, and storing the multiple frames of sampling data;
• calculating noise of the plurality of data sampling points according to the multiple frames of sampling data to obtain a noise test result;
• and
• uploading the noise test result to an upper computer.