Methods and apparatus for spin wave-based spectrum analyzers
AssigneeUniversity of Notre Dame du Lac
InventorsGyorgy Csaba, Adam Papp, Jonathan Chisum, Wolfgang Porod, Gary Bernstein
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Abstract
An example device includes a magnetic film, two or more spin wave generators, and one or more detectors. The magnetic film is capable of supporting spin waves. The two or more spin wave generators are operable to create a diffraction pattern of the spin waves in the magnetic film. The two or more spin wave generators generate the spin waves based on a source signal. The one or more detectors are operable to measure an amplitude of the spin waves in the diffraction pattern. The amplitude measured by a particular detector is indicative of a property of the source signal.
Claims21
A device comprising:
- a magnetic film having a concave patterned edge, wherein the concave patterned edge forms an arc having a first radius;
- an antenna disposed laterally adjacent to the concave patterned edge and substantially coplanar with the magnetic film, wherein the antenna is operable to generate a magnetic field based on a source signal that interacts with at least the concave patterned edge of the magnetic film to produce spin waves in the magnetic film;
- and
- at least one sensor positioned substantially at a particular location along a circumference of a Rowland circle on the magnetic film having a second radius, wherein the first radius is twice that of the second radius, and wherein the at least one sensor is operable to measure at least one physical property of the magnetic film at the particular location.
A spectrum analyzer comprising:
- a substantially rectangular magnetic film that includes a plurality of element spaced periodically on a portion of the magnetic film;
- an antenna disposed vertically adjacent to the portion of the magnetic film, wherein the antenna is operable to generate a magnetic field based on a source signal that interacts with the magnetic film and the plurality of elements to produce spin waves in the magnetic film;
- and
- at least one sensor positioned substantially at a particular location along a circumference of a Rowland circle on the magnetic film having a second radius, wherein the at least one sensor is operable to measure at least one physical property of the magnetic film at the particular location.
A method comprising:
- generating, by an antenna, a magnetic field that interacts with a concave patterned edge of a magnetic film to produce spin waves in the magnetic film;
- measuring, by at least one sensor positioned substantially at a location on the magnetic film at which spin waves of a particular wavelength are focused, at least one property of the spin waves at the location;
- and
- determining, based on a known relationship between the at least one property of the spin waves at the location and a power of the particular wavelength of the source signal, the power of the particular wavelength of the source signal.
A device comprising:
- a magnetic film capable of supporting spin waves;
- two or more spin wave generators operable to create a diffraction pattern of the spin waves in the magnetic film, wherein the two or more spin wave generators generate the spin waves based on a source signal;
- and
- one or more detectors operable to measure an amplitude of the spin waves in the diffraction pattern, wherein the amplitude measured by a particular detector is indicative of a property of the source signal.
Dependencies are inferred from the claim text.