Determining oxidation of photoconductor members
AssigneeHewlett-Packard Indigo B.V.
InventorsEviatar Golan, Fernanda Orlik, Mirit Shitrit, Sasi Moalem, Reut Diamant
Life of this patent
Estimating the term…
Abstract
A method is described in which a spectrum of a surface of a photoconductor member is obtained using optical spectroscopy; and an extent of oxidation of the surface is determined based on the obtained spectrum.
Claims15
A method comprising:
- obtaining, using optical spectroscopy, a spectrum of a surface of a photoconductor member;
- and
- determining an extent of oxidation of the surface based on the obtained spectrum.
A method as claimed in 6 wherein the assessing step comprises comparing the determined extent of oxidation to a threshold, and wherein assessing whether to clean the surface of the photoconductor member is based on the comparison.
An apparatus comprising:
- an optical spectrometer to obtain a spectrum of a surface of a photoconductor member;
- and
- a processing unit to:
- receive a spectrum obtained by the optical spectrometer;
- and
- determine an extent of oxidation of the surface based on the received spectrum.
A non-transitory machine-readable storage medium encoded with instructions executable by a processor, the machine-readable storage medium comprising:
- instructions to detect receipt by the processor of a spectrum of a surface of a photoconductor member obtained using optical spectroscopy;
- and
- instructions to determine an extent of oxidation of the surface of the photoconductor member based on the received spectrum.
Dependencies are inferred from the claim text.