Determining spectral emission characteristics of incident radiation
AssigneeHeptagon Micro Optics Pte. Ltd.
InventorsPeter Roentgen, Jens Geiger, Markus Rossi
Life of this patent
Estimating the term…
Loading patent…
AssigneeHeptagon Micro Optics Pte. Ltd.
InventorsPeter Roentgen, Jens Geiger, Markus Rossi
Estimating the term…
The present disclosure describes optical radiation sensors and detection techniques that facilitate assigning a specific wavelength to a measured photocurrent. The techniques can be used to determine the spectral emission characteristics of a radiation source. In one aspect, a method of determining spectral emission characteristics of incident radiation includes sensing at least some of the incident radiation using a light detector having first and second photosensitive regions whose optical responsivity characteristics differ from one another. The method further includes identifying a wavelength of the incident radiation based on a ratio of a photocurrent from the first region and a photocurrent from the second region.
A method of determining spectral emission characteristics of incident radiation, the method comprising:
A system for determining spectral emission characteristics of incident radiation, the system comprising:
A system for determining spectral emission characteristics of incident light, the system comprising:
Dependencies are inferred from the claim text.