Measuring probe
AssigneeMitutoyo Corporation
InventorsSatoshi KOGA, Akinori SAITO, Hiroyuki KANAMORI, Yutaka KURIYAMA, Nobuhiro ISHIKAWA
Life of this patent
Estimating the term…
Loading patent…
AssigneeMitutoyo Corporation
InventorsSatoshi KOGA, Akinori SAITO, Hiroyuki KANAMORI, Yutaka KURIYAMA, Nobuhiro ISHIKAWA
Estimating the term…
A measuring probe includes two supporting members, each having a rotationally symmetric shape and allowing for an attitude change of a stylus, in an axial direction of a probe housing. Four detection elements are disposed at fourfold symmetric positions in one of the two supporting members that includes four deformable arm parts. A signal processing circuit includes a first processing part that processes outputs of the detection elements to output three displacement signals representing displacement components of a contact part in mutually perpendicular three directions, respectively. The measuring probe capable of reducing measurement directional dependency of sensitivity with a simple configuration while maintaining high sensitivity is thus provided.
A measuring probe comprising:
Dependencies are inferred from the claim text.